Speaker
Mr
Sergey Bobkov
(NATIONAL RESEARCH CENTRE "KURCHATOV INSTITUTE")
Description
In our work we present a new method of feature vector calculation for XFEL diffraction patterns. Existing methods of image feature vector calculation developed for computer vision and patterns recognition are not effective for diffraction patterns analysis since they don't take into account inner properties of diffraction physics. In our research we developed the new method based on connection between spatial structure of a particle and pattern properties. Results showed that our approach improved classification, separation and clustering of experimental diffraction data.
Primary author
Mr
Sergey Bobkov
(NATIONAL RESEARCH CENTRE "KURCHATOV INSTITUTE")
Co-authors
Mr
Anton Teslyuk
(NATIONAL RESEARCH CENTRE "KURCHATOV INSTITUTE")
Dr
Ivan Vartanyants
(DESY)
Ms
Marina Golosova
(NATIONAL RESEARCH CENTRE "KURCHATOV INSTITUTE")
Dr
Oleg Gorobtsov
(DESY)
Dr
Oleksandr Yefanov
(DESY)
Dr
Vyacheslav Ilyin
(NATIONAL RESEARCH CENTRE "KURCHATOV INSTITUTE")