XFEL diffraction patterns representation method for classification, indexing and search.

Jul 2, 2014, 4:50 PM
20m
Conference Hall (LIT JINR)

Conference Hall

LIT JINR

Russia, 141980 Moscow region, Dubna, JINR
sectional reports Section 3 - Technology for storaging, searching and processing of Big Data Technology for storaging, searching and processing of Big Data

Speaker

Mr Sergey Bobkov (NATIONAL RESEARCH CENTRE "KURCHATOV INSTITUTE")

Description

In our work we present a new method of feature vector calculation for XFEL diffraction patterns. Existing methods of image feature vector calculation developed for computer vision and patterns recognition are not effective for diffraction patterns analysis since they don't take into account inner properties of diffraction physics. In our research we developed the new method based on connection between spatial structure of a particle and pattern properties. Results showed that our approach improved classification, separation and clustering of experimental diffraction data.

Primary author

Mr Sergey Bobkov (NATIONAL RESEARCH CENTRE "KURCHATOV INSTITUTE")

Co-authors

Mr Anton Teslyuk (NATIONAL RESEARCH CENTRE "KURCHATOV INSTITUTE") Dr Ivan Vartanyants (DESY) Ms Marina Golosova (NATIONAL RESEARCH CENTRE "KURCHATOV INSTITUTE") Dr Oleg Gorobtsov (DESY) Dr Oleksandr Yefanov (DESY) Dr Vyacheslav Ilyin (NATIONAL RESEARCH CENTRE "KURCHATOV INSTITUTE")

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